Optical Fiber Time Delay Comparison Between NIST and LAMETRO

Author:

Dennis Tasshi1,Jimenez J.2

Affiliation:

1. National Institute of Standards and Technology, Communications Technology Laboratory, RF Technology Division, Boulder, CO 80305, USA

2. Laboratorio de Metrología (LAMETRO), Instituto Costarricense de Electricidad (ICE), San José, 10032-1000, Costa Rica

Abstract

We describe the results of a bilateral measurement comparison of optical fiber time delay between the National Institute of Standards and Technology (NIST, USA) and Laboratorio de Metrología, Instituto Costarricense de Electricidad (LAMETRO-ICE, Costa Rica), which was conducted on a single-mode optical fiber reference spool at wavelengths of 1310 nm and 1550 nm. The measurement results showed the largest difference to be less than 0.93 ns, which is within the combined standard uncertainty (coverage factor k = 1) for the measurement systems at the two laboratories.

Funder

Communications Technology Laboratory

Publisher

National Institute of Standards and Technology (NIST)

Subject

General Engineering

Reference5 articles.

1. International Organization for Standardization (2008) Evaluation of Measurement Data—Guide to the Expression of Uncertainty in Measurement (International Organization for Standardization, Geneva, Switzerland). Available at https://www.bipm.org/utils/common/documents/jcgm/JCGM_100_2008_E.pdf

2. Characterization of an optical fiber spool to be used as reference standard for OTDRs distance scale calibration

3. International Electrotechnical Commission (2001) IEC International Standard 60793-1-22—Optical fibers, Part 1-22: Measurement methods and test procedures—Length measurement (IEC, Geneva, Switzerland). Available at https://webstore.iec.ch/publication/3446

4. Accurate measurements of the zero-dispersion wavelength in optical fibers

5. International Electrotechnical Commission (2009) IEC International Standard 61746-1—Calibration of optical time-domain reflectometers (OTDR)—Part 1: OTDR for single mode fibres (IEC, Geneva, Switzerland). Available at https://webstore.iec.ch/publication/5748

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