Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals, and Devices
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Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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4. Time-of-Flight pulsed ion beam surface analysis as a means of in situ, real-time characterization of the growth of ferro-electric and conductive oxide heterostructures;Integrated Ferroelectrics;1995-03
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