Micro Raman Spectroscopy Analysis of Doped Amorphous and Microcrystalline Silicon Thin Film Layers and its Application in Heterojunction Silicon Wafer Solar Cells-Reference-Cited by-同舟云学术

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Micro Raman Spectroscopy Analysis of Doped Amorphous and Microcrystalline Silicon Thin Film Layers and its Application in Heterojunction Silicon Wafer Solar Cells

Published:2014 Issue:1 Volume:39 Page:11-18
ISSN:1382-3469
Container-title:Transactions of the Materials Research Society of Japan
language:en
Short-container-title:Trans. Mat. Res. Soc. Japan

Author:

Ling Zhi Peng¹²,Ge Jia¹³,Rolf Stangl¹,Aberle Armin Gerhard¹²,Mueller Thomas¹

Affiliation:

1. Solar Energy Research Institute of Singapore, National University of Singapore

2. Department of Electrical and Computer Engineering, National University of Singapore

3. Graduate School for Integrative Sciences and Engineering, National University of Singapore

Publisher

The Materials Research Society of Japan

Link

https://www.jstage.jst.go.jp/article/tmrsj/39/1/39_11/_pdf

Reference36 articles.

1. [1] J. Zhao, A. Wang, and M.A. Green, Progress in Photovoltaics: Research and Applications, 1(3), 193-202 (1993).

2. [2] A. Zunger, Appl. Phys. Lett., 83(1), 57-59 (2003).

3. [3] S.D. Wolf and M. Kondo, J. Appl. Phys., 105, 103707 (2009).

4. [4] Z Iqbal and S. Veprek, J. Phys. C: Solid State Phys, 15(2), 377 (1982).

5. [5] M. Ledinský, A. Vetushka, J. Stuchlík, A. Fejfar, and J. Kočka, physica status solidi (c), 7(3-4), 704-707 (2010).

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