An equation of average lifetime of the minority carriers in semiconductors from photo-electrochemical measurement-Reference-Cited by-同舟云学术

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An equation of average lifetime of the minority carriers in semiconductors from photo-electrochemical measurement

Published:2013 Issue:3 Volume:38 Page:385-388
ISSN:1382-3469
Container-title:Transactions of the Materials Research Society of Japan
language:en
Short-container-title:Trans. Mat. Res. Soc. Japan

Author:

Muhibbullah M.¹,Golam Mowla Choudhury M.¹,Mominuzzaman Sharif M.²,Vequizo Junie Jhon M.³,Kai Yang³

Affiliation:

1. Department of Electronics and Telecommunication Engineering, Daffodil International University

2. Department of Electrical and Electronic Engineering, Bangladesh University of Engineering and Technology (BUET)

3. Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology

Publisher

The Materials Research Society of Japan

Link

https://www.jstage.jst.go.jp/article/tmrsj/38/3/38_385/_pdf

Reference17 articles.

1. [1] Muhammad Muhibbullah and Masaya Ichimura, Transactions of the Materials Research Society of Japan, 36[2], (2011), 195-198.

2. [2] Muhammad Muhibbullah and Masaya Ichimura, Japanese Journal of Applied Physics, 49 (2010), 081102-1 to 081102-4.

3. [3] M. Muhibbullah, M. Ichimura / Materials Research Bulletin 47 (2012) 1968-1972.

4. [4] A.M. Abdel Haleem, M. Ichimura, Thin Solid Films 516 (2008) 7783-7789.

5. [5] Ashraf M. Abdel Haleem and Masaya Ichimura, Japanese Journal of Applied Physics 48 (2009) 035506.

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1. Estimation of the Open Circuit Voltage of a pn Junction Based on Photoelectrochemical Measurements;Transactions of the Materials Research Society of Japan;2015

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