Computer Simulation on Spatial Resolution of Refraction X-ray Dark-Field Imaging by Dynamical Diffraction Theory for a Laue-case Crystal Analyzer-Reference-Cited by-同舟云学术

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Computer Simulation on Spatial Resolution of Refraction X-ray Dark-Field Imaging by Dynamical Diffraction Theory for a Laue-case Crystal Analyzer

Published:2013 Issue:3 Volume:38 Page:405-408
ISSN:1382-3469
Container-title:Transactions of the Materials Research Society of Japan
language:en
Short-container-title:Trans. Mat. Res. Soc. Japan

Author:

Suzuki Yoshifumi¹,Chikaura Yoshinori²,Ando Masami³

Affiliation:

1. Graduate School of Engineering, Kyushu Institute of Technology

2. Research Center for Synchrotron Light Applications, Kyushu University

3. RIST, Tokyo Univ. of Science

Publisher

The Materials Research Society of Japan

Link

https://www.jstage.jst.go.jp/article/tmrsj/38/3/38_405/_pdf

Reference5 articles.

1. [1] M. Ando, H. Sugiyama, S. Ichihara, T. Endo, H. Bando, K. Yamasaki, C. Ohbayashi, Y. Chikaura, H. Esumi, A. Maksimenko and G. Li, Jpn. J. Appl. Phys. 45, L740, (2006).

2. [2] S. Takakgi: Acta Crystllogr., 15, 1311 (1962). B. Klar and F. Rustichelli, Dynamical Neutron Diffraction by Ideally Curved Crystals (1973).

3. [3] Y. Suzuki, Y. Chikaura, M. Ando, J. Appl. Phys. 110, 084902 (2011).

4. [4] Y. Epelboin, Acta Cryst. A33, 758-767 (1977).

5. [5] M. Ando, Q. Huo, N. Sunaguchi, K. Hirano, K. Hyodo, T. Yuasa, Y. Wu, Y. Suzuki, Y. Chikaura, T. Takahashi, M.-T. Tang, C.-H. Chu, S. Ichihara, T. Endo, the annual meeting of Applied Physics Society in Japan (APSJ) which will be held on March 15^th-16^th.

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