A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography-Reference-Cited by-同舟云学术

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A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography

Published:2023 Issue:3 Volume:53 Page:217
ISSN:2233-7822
Container-title:Imaging Science in Dentistry
language:en
Short-container-title:Imaging Sci Dent

Author:

Nouchi Shun¹^ORCID,Yoshida Hidenori²^ORCID,Miki Yusaku¹^ORCID,Tezuka Yasuhito³^ORCID,Ogawa Ruri³^ORCID,Ogura Ichiro¹³^ORCID

Affiliation:

1. Department of Radiology, The Nippon Dental University Niigata Hospital, Niigata, Japan.

2. Department of Radiological Technology, Niigata University of Health and Welfare, Niigata, Japan.

3. Department of Oral and Maxillofacial Radiology, The Nippon Dental University School of Life Dentistry at Niigata, Niigata, Japan.

Publisher

XMLink

Subject

Radiology, Nuclear Medicine and imaging,General Dentistry,Radiological and Ultrasound Technology

Link

https://isdent.org/pdf/10.5624/isd.20230039

Reference10 articles.

1. Measurement of the half-value layer for CT systems in a single-rotation technique: Reduction of stray radiation with lead apertures

2. Accuracy of HVL measurements utilizing solid state detectors for radiography and fluoroscopy X‐ray systems

3. Improvements in image quality after optimization in digital intraoral radiographs

4. Effect of K-shell absorption edge filters on image quality in digital intraoral radiography

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