Depth of origin of sputtered atoms (Technical Report)-Reference-Cited by-同舟云学术

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Depth of origin of sputtered atoms (Technical Report)

Published:1993-01-01 Issue:11 Volume:65 Page:2361-2372
ISSN:1365-3075
Container-title:Pure and Applied Chemistry
language:
Short-container-title:

Author:

Pellin M. J.,Burnett J. W.

Publisher

Walter de Gruyter GmbH

Subject

General Chemical Engineering,General Chemistry

Link

https://www.degruyter.com/document/doi/10.1351/pac199365112361/pdf

Reference2 articles.

1. Surface and;Lam;Interface Analysis,1988

2. Pure;Morita;Intrum Methods Phys Res Appl Chem,1985

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