A Data-driven Approach for Mitigating Dark Current Noise and Bad Pixels in Complementary Metal Oxide Semiconductor Cameras for Space-based Telescopes

Abstract

Abstract In recent years, there has been a gradual increase in the performance of complementary metal oxide semiconductor (CMOS) cameras. These cameras have gained popularity as a viable alternative to charge-coupled device cameras in a wide range of applications. One particular application is the CMOS camera installed in small space telescopes. However, the limited power and spatial resources available on satellites present challenges in maintaining ideal observation conditions, including temperature and radiation environment. Consequently, images captured by CMOS cameras are susceptible to issues such as dark current noise and defective pixels. In this paper, we introduce a data-driven framework for mitigating dark current noise and bad pixels for CMOS cameras. Our approach involves two key steps: pixel clustering and function fitting. During the pixel clustering step, we identify and group pixels exhibiting similar dark current noise properties. Subsequently, in the function fitting step, we formulate functions that capture the relationship between dark current and temperature, as dictated by the Arrhenius law. Our framework leverages ground-based test data to establish distinct temperature–dark current relations for pixels within different clusters. The cluster results could then be utilized to estimate the dark current noise level and detect bad pixels from real observational data. To assess the effectiveness of our approach, we have conducted tests using real observation data obtained from the Yangwang-1 satellite, equipped with a near-ultraviolet telescope and an optical telescope. The results show a considerable improvement in the detection efficiency of space-based telescopes.