X-Ray Polarimetry as a Tool to Constrain Orbital Parameters in X-Ray Binaries

Abstract

Abstract X-ray binary systems consist of a companion star and a compact object in close orbit. Thanks to their copious X-ray emission, these objects have been studied in detail using X-ray spectroscopy and timing. The inclination of these systems is a major uncertainty in the determination of the mass of the compact object using optical spectroscopic methods. In this paper, we present a new method to constrain the inclination of X-ray binaries, which is based on the modeling of the polarization of X-rays photons produced by a compact source and scattered off the companion star. We describe our method and explore the potential of this technique in the specific case of the low-mass X-ray binary GS 1826−238 observed by the Imaging X-ray Polarimetry Explorer observatory.