Monte Carlo Applications for Partially Polarized Inverse External-Compton Scattering (MAPPIES). II. Application to the UV/Soft X-Ray Excess in Blazar Spectra

Abstract

Abstract The spectral energy distributions (SEDs) of some blazars exhibit an ultraviolet (UV) and/or soft X-ray excess that can be modeled with different radiation mechanisms. Polarization measurements of the UV/X-ray emission from blazars may provide new and unique information about the astrophysical environment of blazar jets, and could thus help to distinguish between different emission scenarios. In this paper, a new Monte Carlo code—Monte Carlo Applications for Partially Polarized Inverse External-Compton Scattering—for polarization-dependent Compton scattering is used to simulate the polarization signatures in a model where the UV/soft X-ray excess arises from the bulk Compton process. Predictions of the expected polarization signatures of Compton emission from the soft X-ray excess in the SED of AO 0235+164 and the UV excess in the SED of 3C 279 are made for upcoming and proposed polarimetry missions.