Affiliation:
1. Department of Physics, School of Science, University of Management and Technology, Pakistan
Abstract
In the present work the refractive indices of thermally evaporated films of cadmium sulfide (CdS) on fused silica substrates were obtained from measurement of transmittance (T, alone) at normal incidence. Earlier, the same were determined by using measurements of reflectance (R) and transmittance (T) again at normal incidence. On comparison of the two results, we noted that the present results are in fact more, closer than those obtained earlier to the corresponding values reported for the bulk cadmium sulfide.
Publisher
University of Management and Technology
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