Author:
,Sakovich L., , ,Gnatiuk S., ,Semekha S., ,Volosheniuk D., ,Popov I.,
Abstract
The authors analyze modern achievements in technical diagnostics and metrology and their possibility to improve the quality of diagnostic support of promising and existing radio-electronic technical means. A general algorithm for the development of diagnostic support for radio-electronic devices is proposed, taking into account their structure, repair conditions, and metrological support to minimize the average recovery time. Keywords: radio-electronic means, technical diagnostics, diagnostic and metrological support.
Publisher
V.M. Glushkov Institute of Cybernetics
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