Analysis of EMP Coupling to a Device from A Wire Penetrating a Cavity Aperture Using Transient Electromagnetic Topology-Reference-Cited by-同舟云学术

Analysis of EMP Coupling to a Device from A Wire Penetrating a Cavity Aperture Using Transient Electromagnetic Topology

Published:2009-01-01 Issue:17-18 Volume:23 Page:2313-2322
ISSN:0920-5071
Container-title:Journal of Electromagnetic Waves and Applications
language:en
Short-container-title:Journal of Electromagnetic Waves and Applications

Author:

Xie H.¹,Wang J.²,Sun D.³,Fan R.⁴,Liu Y.⁵

Affiliation:

1. a Department of Engineering Physics, Tsinghua University, Beijing 100084, China;, Email: xiehy05@mails.tsinghua.edu.cn

2. b Department of Engineering Physics, Tsinghua University, Beijing 100084, China, The Northwest Institute of Nuclear Technology, P. O. Box 69-1, Xi'an, Shaanxi 710024, China

3. c Northwest Institute of Nuclear Technology, P. O. Box 69-10, Xi'an, Shaanxi 710024, China

4. d Department of Engineering Physics, Tsinghua University, Beijing 100084, China, The Northwest Institute of Nuclear Technology, P. O. Box 69-1, Xi'an, Shaanxi 710024, China

5. e Department of Engineering Physics, Tsinghua University, Beijing 100084, China

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,General Physics and Astronomy,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1163/156939309790416044

Reference14 articles.

1. An Efficient Hybrid Method for Calculating the EMC Coupling to a Device on a Printed Circuit Board inside a Cavity by a Wire Penetrating an Aperture

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