A Novel Technique for Localizing the Scatterer in Inverse Profiling of Two Dimensional Circularly Symmetric Dielectric Scatterers Using Degree of Symmetry and Neural Networks-Reference-Cited by-同舟云学术

A Novel Technique for Localizing the Scatterer in Inverse Profiling of Two Dimensional Circularly Symmetric Dielectric Scatterers Using Degree of Symmetry and Neural Networks

Published:2005-01 Issue:15 Volume:19 Page:2113-2121
ISSN:0920-5071
Container-title:Journal of Electromagnetic Waves and Applications
language:en
Short-container-title:Journal of Electromagnetic Waves and Applications

Author:

Thomas V.,Gopakumar C.,Yohannan J.,Lonappan A.,Bindu G.,Praveen Kumar A. V.,Hamsakutty V.,Mathew K. T.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,General Physics and Astronomy,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1163/156939305775570477

Reference12 articles.

1. An iterative solution of the two-dimensional electromagnetic inverse scattering problem

2. Reconstruction of two-dimensional permittivity distribution using the distorted Born iterative method

3. Inverse scattering: an iterative numerical method for electromagnetic imaging

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