Electromagnetic Material Characterization using a Partially-Filled Rectangular Waveguide-Reference-Cited by-同舟云学术

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Electromagnetic Material Characterization using a Partially-Filled Rectangular Waveguide

Published:2005-01 Issue:10 Volume:19 Page:1291-1306
ISSN:0920-5071
Container-title:Journal of Electromagnetic Waves and Applications
language:en
Short-container-title:Journal of Electromagnetic Waves and Applications

Author:

Bogle A.,Havrilla M.,Nyquis D.,Kempel L.,Rothwell E.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,General Physics and Astronomy,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1163/156939305775525909

Reference18 articles.

1. Automatic measurement of complex dielectric constant and permeability at microwave frequencies

2. Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

3. Improved technique for determining complex permittivity with the transmission/reflection method

4. Dielectric characterization of low-loss materials a comparison of techniques

5. Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines

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1. Complex Dielectric Permittivity Measurement of 3D Printing Resin FTD Nano Clear in the 1–10 GHz Band;2023 Seminar on Microelectronics, Dielectrics and Plasmas (MDP);2023-11-20

2. Current State of Analysis and Optimal Synthesis of Microwave Waveguide Systems of Complex Structure;Radio Engineering and Telecommunications Waveguide Systems in the Microwave Range;2023-08-27

3. Computational electromagnetic analysis of partially-filled rectangular waveguide at X-band frequencies;Nonlinear Analysis: Modelling and Control;2022-10-19

4. Experimental Study of the Effect of Partial Dielectric Filling on Electrodynamic Characteristics and Rectangular Waveguide Dimensions;VISNYK NTUU KPI SER-;2022

5. Modified Waveguide-Based Method for Microwave Characterization of High-Loss Materials;IEEE Transactions on Instrumentation and Measurement;2022

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