1. T. Yasokawa, I. Ishimaru, F. Oohira, R. Hyodo, H. Kobayashi, A. Hayashi, Y. Inoue, and K. Ishizaki, “Proposal of spectroscopytomography of single-cell,” Optomechatronic Micro/Nano Components, Devices, and Systems, Proceedings of SPIE, Vol.5604, pp. 108-117, 2004.
2. A. Hayashi, F. Oohira, I. Ishimaru, S. Hata, S. Kaio, H. Kobayashi, and M. Minami, “Experimental Confirmation of the Variable Phase-Contrast Microscope Using Piezo-Electric Actuator,” Proceedings of ASME 2002 Japan-USA Symposium on Flexible Automation (2002JUSFA),Vol.III, pp. 1321-1324, 2002.
3. R. Hyoudou, S. Kaio, F. Oohira, A. Hayashi, and I. Ishimaru, “Proposal of variable-phase contrast microscope for nano-geometry measurement,” Optics Japan 2002, Extended Abstracts of Optics Japan 2002 The Optical Society of Japan, pp. 216-217, 2002.
4. A. Hayashi, F. Oohira, I. Ishimaru, S. Hata, R. Hyodo, S. Kaio, and M. Minami, “Nano-Micro Meter Size Geometry Measurement using Variable Phase-Contrast Microscope with Piezo-Electric Actuator,” Proc. of 2nd Japan-China Workshop on Multidisciplinary Researches in Engineering, pp. 194-199, 2003.
5. H. Kobayashi, I. Ishimaru, G. Hashiguchi, F. Oohira, S. Kaio, and A. Hayashi, “A Proposal of Variable Phase-Contrast Microscope for Nano Geometry Measurement,” Proc. of ASME 2002 Japan-USA Symposium on Flexible Automation (2002JUSFA), Vol.III, pp. 1317-1320, 2002.