Assessment of Radiation Tolerance of Flash Memory by γ-Ray Irradiation-Reference-Cited by-同舟云学术

Assessment of Radiation Tolerance of Flash Memory by γ-Ray Irradiation

Published:2024-02-20 Issue:1 Volume:36 Page:88-94
ISSN:1883-8049
Container-title:Journal of Robotics and Mechatronics
language:en
Short-container-title:JRM

Author:

Takakura Kenichiro¹^ORCID, ,Matsumoto Kensuke²,Tateishi Kousei²,Yoneoka Masashi³,Tsunoda Isao¹^ORCID,Suzuki Shigekazu⁴,Kawatsuma Shinji⁴^ORCID

Affiliation:

1. Faculty of Electronics and Information Systems Engineering, Kumamoto KOSEN, 2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan

2. Electronics and Information Systems Engineering Advanced Course, Kumamoto KOSEN, 2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan

3. Center for Technical and Educational Support, Kumamoto KOSEN, 2659-2 Suya, Koshi city, Kumamoto 861-1102, Japan

4. Department of Mechanical System Engineering, Fukushima KOSEN, 30 Nagao, Kamiarakawa, Taira, Iwaki, Fukushima 970-8034, Japan

Abstract

The radiation tolerance of a microcontroller (Raspberry Pi) required for the development of decommissioning robots was investigated. We found that the flash memory needed to boot the microcontroller had particularly low-radiation tolerance, significantly reducing the operation duration of the microcontroller in a radiation environment. We also found that certain high-performance flash memories have high radiation tolerance. Investigation of the process by which flash memory becomes inoperable revealed that internal memory information is rewritten owing to irradiation, leading to limited lifetime for memory.

Funder

Japan Society for the Promotion of Science

Publisher

Fuji Technology Press Ltd.

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