Eccentric Connectivity Index of Nanosheets and Nanotube of SiO2
Author:
Affiliation:
1. School of Advanced Sciences, Vellore Institute of Technology, Vandalur-Kelambakkam Road, Chennai, Tamil Nadu 600127, India
Abstract
Publisher
Fuji Technology Press Ltd.
Subject
Artificial Intelligence,Computer Vision and Pattern Recognition,Human-Computer Interaction
Reference7 articles.
1. V. Sharma, R. Goswami, and A. K. Madan, “Eccentric connectivity index: A novel highly discriminating topological descriptor for structure–property and structure–activity studies,” J. of Chemical Information and Computer Sciences, Vol.37, No.2, pp. 273-282, 1997. https://doi.org/10.1021/ci960049h
2. X. Zhang, M. K. Siddiqui, M. Naeem, and A. Q. Baig, “Computing Eccentricity Based Topological Indices of Octagonal Grid Onm,” Mathematics, Vol.6, No.9, Article No.153, 2018. https://doi.org/10.3390/math6090153
3. H. Shaker, M. Imran, and W. Sajjad, “Eccentricity based topological indices of face centered cubic lattice FCC(n),” Main Group Metal Chemistry, Vol.44, No.1, pp. 32-38, 2016. https://doi.org/10.1515/mgmc-2021-0005
4. M. Arockiaraj, S. Klavžar, S. Mushtaq, and K. Balasubramanian, “Distance-based topological indices of nanosheets, nanotubes and nanotori of SiO2,” J. of Mathematical Chemistry, Vol.57, No.1, pp. 343-369, 2019. https://doi.org/10.1007/s10910-018-0956-8
5. F. Farrukh, Sabeel-e-Hafi, R. Farooq, and M. R. Farahani, “Calculating Some Topological Indices of SiO2 Layer Structure,” J. of Informatics and Mathematical Sciences, Vol.8, No.3, pp. 181-187, 2016.
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