An Improved Genome Sequence Resource of <i>Bipolaris maydis</i>, Causal Agent of Southern Corn Leaf Blight-Reference-Cited by-同舟云学术

An Improved Genome Sequence Resource of Bipolaris maydis, Causal Agent of Southern Corn Leaf Blight

Published:2022-06 Issue:6 Volume:112 Page:1386-1390
ISSN:0031-949X
Container-title:Phytopathology®
language:en
Short-container-title:Phytopathology®

Author:

Wang Yafei¹²,Kang Houxiang¹,Yao Jinai¹³,Li Zhiqiang¹,Xia Xinyao¹^ORCID,Zhou Shaoqun²,Liu Wende¹^ORCID

Affiliation:

1. State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Sciences, 100193, Beijing, China

2. Shenzhen Branch, Guangdong Laboratory of Lingnan Modern Agriculture, Genome Analysis Laboratory of the Ministry of Agriculture and Rural Affairs, Agricultural Genomics Institute at Shenzhen, Chinese Academy of Agricultural Sciences, 440307, Shenzhen, China

3. Fujian Key Laboratory for Monitoring and Integrated Management of Crop Pests/Institute of Plant Protection, Fujian Academy of Agricultural Sciences, 350013, Fuzhou, China

Funder

National Natural Science Foundation of China

Agricultural Science and Technology Innovation Program

Shenzhen Science and Technology Program

Publisher

Scientific Societies

Subject

Plant Science,Agronomy and Crop Science

Link

https://apsjournals.apsnet.org/doi/pdf/10.1094/PHYTO-11-21-0490-A

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4. Identification and Mapping of Quantitative Trait Loci Conditioning Resistance to Southern Leaf Blight of Maize Caused by Cochliobolus heterostrophus Race O

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