A Solar Cell Characteristic Measurement Device Based on STM32

Abstract

With the increasing development of the new energy photovoltaic (PV) industry and in-depth research of PV materials, it has become crucial to measure the characteristics of such materials. This enables R&D personnel to quickly iterate PV materials for further advancements. In the traditional R&D of photovoltaic materials, researchers often need to continuously iterate the materials, repeatedly measure the experimental materials, and ultimately get the best material ratio structure. Therefore, this paper designed an experimental device based on the STM32 chip for measuring solar cell characteristics. It can accurately and quickly measure the characteristics of a certain solar cell. CIGS thin-film solar cells were used as the experimental materials, and the light-dark voltammetry and temperature resistance experiments were done in turn. Therefore, it proved that the device has great commercial prospects.