Author:
Jaafar Miriam,Serrano-Ramón Luis,Iglesias-Freire Oscar,Fernández-Pacheco Amalio,Ibarra Manuel Ricardo,De Teresa Jose Maria,Asenjo Agustina
Abstract
Abstract
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,General Materials Science
Cited by
51 articles.
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