Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy-Reference-Cited by-同舟云学术

Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Published:2016-07-13 Issue:1 Volume:5 Page:
ISSN:2193-1801
Container-title:SpringerPlus
language:en
Short-container-title:SpringerPlus

Author:

Nik Samira,Krantz Philip^ORCID,Zeng Lunjie,Greibe Tine,Pettersson Henrik,Gustafsson Stefan,Delsing Per,Olsson Eva

Funder

Stiftelsen för Strategisk Forskning (SE)

Vetenskapsrådet (SE)

Knut och Alice Wallenbergs Stiftelse (SE)

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://link.springer.com/content/pdf/10.1186/s40064-016-2418-8.pdf

Reference42 articles.

1. Aref T, Averin A, van Dijken S, Ferring A, Koberidze M, Maisi VF, Nguyend HQ, Nieminen RM, Pekola JP, Yao LD (2014) Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging. J Appl Phys 116:073702

2. Aumentado J, Keller Mark W, Martinis John M, Devoret MH (2004) Nonequilibrium quasiparticles and 2e periodicity in single-cooper-pair transistors. Phys Rev Lett 92:066802

3. Averin DV, Likharev KK (1986) Coulomb blockade of single-electron tunneling, and coherent oscillations in small tunnel junctions. J Low Temp Phys 62:345

4. Cai N, Zhou G, Mller K, Starr DE (2011) Effect of oxygen gas pressure on the kinetics of alumina film growth during the oxidation of Al(111) at room temperature. Phys Rev B 84:125445

5. Cai N, Zhou G, Muller K, Starr DE (2012) Temperature and pressure dependent Mott potentials and their influence on self-limiting oxide film growth. Appl Phys Lett 101:171605

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