Author:
Chen Ming-Jun,Bovik Alan C
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Information Systems,Signal Processing
Reference38 articles.
1. Wang Z, Bovik AC, Sheikh HR, Simoncelli EP: Image quality assessment: from error visibility to structural similarity. IEEE Trans Image Process 2004, 13(4):600-612. 10.1109/TIP.2003.819861
2. Wang Z, Simoncelli EP, Bovik AC: Multi-scale structural similarity for image quality assessment. IEEE Asilomar Conf. Signals, Systems, and Computers 2003, 1398-1402.
3. Sheikh HR, Bovik AC: Image information and visual quality. IEEE Trans Image Process 2006, 15(2):430-444.
4. Chandler DM, Hemami SS: VSNR: a wavelet-based visual signal-to-noise ratio for natural images. IEEE Trans Image Process 2007, 16(9):2284-2298.
5. Caviedes JE, Gurbuz S: No-reference sharpness metric based on local edge kurtosis. IEEE International Conference on Image Processing, Rochester, NY 2002.
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