Author:
Wen Gang,Li Simin,Liang Yong,Wang Linbo,Zhang Jie,Chen Xiaohu,Jin Xin,Chen Chong,Tang Yuguo,Li Hui
Abstract
AbstractSuper-resolution structured illumination microscopy (SR-SIM) has become a widely used nanoscopy technique for rapid, long-term, and multi-color imaging of live cells. Precise but troublesome determination of the illumination pattern parameters is a prerequisite for Wiener-deconvolution-based SR-SIM image reconstruction. Here, we present a direct reconstruction SIM algorithm (direct-SIM) with an initial spatial-domain reconstruction followed by frequency-domain spectrum optimization. Without any prior knowledge of illumination patterns and bypassing the artifact-sensitive Wiener deconvolution procedures, resolution-doubled SR images could be reconstructed by direct-SIM free of common artifacts, even for the raw images with large pattern variance in the field of view (FOV). Direct-SIM can be applied to previously difficult scenarios such as very sparse samples, periodic samples, very small FOV imaging, and stitched large FOV imaging.
Funder
National Natural Science Foundation of China
Key Technologies Research and Development Program
Pilot Projects and Preparatory Actions
Jiangsu Provincial Key Research and Development Program
Publisher
Springer Science and Business Media LLC
Subject
Atomic and Molecular Physics, and Optics,Electrical and Electronic Engineering,Engineering (miscellaneous)
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献