Window detection in facade images for risk assessment in tunneling

Author:

Neuhausen MarcelORCID,Obel Markus,Martin Alexander,Mark Peter,König Markus

Abstract

Abstract Background Settlements induced by tunneling in inner urban areas can easily damage above ground structures. This already has to be considered in early planning of tunneling routes. Assessing the risk of damages to structures on hypothetical tunneling routes inflicted by such settlements beforehand enables routes’ comparability. Hereby, it facilitates the choice of the optimal tunneling route in terms of potential damages and of suitable countermeasures. Risk analyses of structures establishing the assessment obtain relevant data from various sources. Some data even has to be gathered manually. Virtual building models could ease this process and facilitate analyses for entire districts as they combine several required information in a single data set. Commonly, these are yet modelled very coarse. Relevant details like facade openings, which highly affect a structures stiffness, are not included. Methods In this paper, we propose a system which detects windows in facade images. This is used to subsequently enrich existing virtual building models allowing for a precise risk assessment. For this, we apply a sliding window detector which employs a cascaded classifier to obtain windows in images patches. Results Our system yields sufficient results on facade images of several countries showing its general applicability despite regional and architectural variation in the facades’ and windows’ appearance. In an ensuing case study, we assess the risk of damages to structures based on detections of our system using different analysis methods. Conclusions We contrast these results to assessments using manually gathered data. Hereby, we show that the detection rate of our proposed system is sufficient for a reliable estimation of a structure’s damage class.

Publisher

Springer Science and Business Media LLC

Subject

Computer Graphics and Computer-Aided Design,Computer Science Applications,Computer Vision and Pattern Recognition,Engineering (miscellaneous),Modeling and Simulation

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