1. Tyagi AK, Jonsson X, Beelen TGJ, Schilders WHA. Speeding up rare event simulations using Kriging models. In: Proceedings of IEEE 21st workshop on signal and power integrity (SPI). Baveno: IEEE; 2017.
2. Ciampolini L, Lafont J-C, Drissi FT, Morin J-P, Turgis D, Jonsson X, Desclèves C, Nguyen J. Efficient yield estimation through generalized importance sampling with application to NBL-assisted SRAM bitcells. In: Proceedings of the 35th international conference on computer-aided design. ICCAD ’16. New York: ACM; 2016.
3. Haldar A, Mahadevan S. Probability, reliability and statistical methods in engineering design. New York: Wiley; 2000.
4. Singhee A, Rutenbar RA. Statistical blockade: very fast statistical simulation and modeling of rare circuit events and its application to memory design. IEEE Trans Comput-Aided Des Integr Circuits Syst. 2009;28(8):1176–89.
5. Santner T, Williams B, Notz W. The design and analysis of computer experiments. Berlin: Springer; 2003.