Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool-Reference-Cited by-同舟云学术

Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool

Published:2015-02-19 Issue:1 Volume:10 Page:
ISSN:1931-7573
Container-title:Nanoscale Research Letters
language:en
Short-container-title:Nanoscale Res Lett

Author:

Shpotyuk Oleh,Filipecki Jacek,Ingram Adam,Golovchak Roman,Vakiv Mykola,Klym Halyna,Balitska Valentyna,Shpotyuk Mykhaylo,Kozdras Andrzej

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science

Link

http://link.springer.com/article/10.1186/s11671-015-0764-z/fulltext.html

Reference17 articles.

1. Krause-Rehberg R, Leipner H. Positron annihilation in semiconductors: defect studies. Heidelberg: Springer; 1999.

2. Jean YC, Mallon PE, Schrader DM. Principles and application of positron and positronium chemistry. New Jersey-London-Singapore-Hong Kong: World Sci Publ. Co. Pte. Ltd.; 2003.

3. Shpotyuk O, Filipecki J. Free volume in vitreous chalcogenide semiconductors: possibilities of positron annihilation lifetime study. Czestochowa: WSP; 2003.

4. Tao SJ. Positronium annihilation in molecular substances. J Chem Phys. 1972;56:5499–510.

5. Tuomisto F, Makkonen I. Defect identification in semiconductors with positron annihilation: experiment and theory. Rev Modern Phys. 2013;85:1583–631.

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