Nanoprocessing of layered crystalline materials by atomic force microscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,General Materials Science
Link
http://link.springer.com/article/10.1186/s11671-015-0811-9/fulltext.html
Reference31 articles.
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4. Ehrichs EE, Yoon S, de Lozanne AL. Direct writing of 10 run features with the scanning tunneling microscope. Appl Phys Lett. 1988;53:2287–9.
5. Samitsu Y. A study of atomic scale processing using an atomic force microscope. J Jpn Soc Precision Eng. 1995;61–8:1121–5 (in Japanese).
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