1. [1] Tanaka T, Kasahara R (2016) Journal of the Imaging Society of Japan, 55, 348-354 (in Japanese). https://doi.org/10.11370/isj.55.348
2. [2] Hanzawa Y, Ikeda Y, Kurita M, Hasegawa Y (2019) “AI Visual Inspection System”, OMRON TECHNICS, 51, 21-25 (in Japanese)
3. [3] Ministry of Economy, Trade and Industry (2021) “AI dounyu guide book”, Ministry of Economy, Trade and Industry, Tokyo (in Japanese)
4. [4] Tachibana R, Matsubara T, Uehara K (2018) “Anomaly Manufacturing Product Detection using Unregularized Anomaly Score on Deep Generative Models”, Proceedings of the Annual Conference of JSAI 2018 (in Japanese). https://doi.org/10.11517/pjsai.JSAI2018.0_2A103
5. [5] Mei S, Wang Y, Wen G (2018) Sensors, 18, 1064. https://doi.org/10.3390/s18041064