Affiliation:
1. State Key Laboratory of Earthquake Dynamics Institute of Geology, China Earthquake Administration Beijing China
2. HPT Laboratory, Department of Earth Sciences Utrecht University Utrecht The Netherlands
3. Faculty of Civil Engineering and Geosciences Technical University of Delft Delft The Netherlands
Abstract
AbstractFault normal stress (σn) changes dynamically during earthquakes. However, the impact of these changes on fault strength is poorly understood. We explore the effects of rapidly varying σn by conducting rotary‐shear experiments on simulated fault gouges at 1 μm/s, under well‐drained, hydrothermal conditions. Our results show both elastic and anelastic (time‐dependent but recoverable) changes in gouge layer thickness in response to step changes and sinusoidal oscillations in σn. In particular, we observe dilation associated with marked weakening during ongoing σn‐oscillations at frequencies >0.1 Hz. Moreover, recovery of shear stress after such oscillations is accompanied by transient (anelastic) compaction. We propose a microphysically based friction model that explains most of the observations made, including the effects of temperature and step versus sinusoidal perturbation modes. Our results highlight that σn‐oscillations above a specific frequency threshold, controlled by the loading regime and frictional properties of the fault, may enhance seismic hazards.
Publisher
American Geophysical Union (AGU)