Analog Models of Lithospheric‐Scale Rifting Monitored in an X‐Ray CT Scanner
Author:
Affiliation:
1. Institute of Geological Sciences University of Bern Bern Switzerland
2. Helmholtz Centre Potsdam ‐ GFZ German Research Centre for Geosciences Potsdam Germany
Funder
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
Helmholtz-Zentrum Potsdam - Deutsches GeoForschungsZentrum GFZ
Publisher
American Geophysical Union (AGU)
Subject
Geochemistry and Petrology,Geophysics
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1029/2022TC007291
Reference122 articles.
1. Quantitative 3D strain analysis in analogue experiments simulating tectonic deformation: Integration of X-ray computed tomography and digital volume correlation techniques
2. Shear localisation and strain distribution during tectonic faulting—new insights from granular-flow experiments and high-resolution optical image correlation techniques
3. Evolution, pattern, and partitioning of deformation during oblique continental rifting: Inferences from lithospheric-scale centrifuge models
4. Width of continental rifts and rheological layering of the lithosphere
5. Symetrie et asymetrie des rifts et mecanismes d'amincissement de la lithosphere
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1. Selective inversion of rift basins in lithospheric-scale analogue experiments;Solid Earth;2023-08-29
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