Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels-Reference-Cited by-同舟云学术

Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels

Author:

Yoshino K.¹²³,Morita Y.²³,Nagatomi T.¹³,Terauchi M.²³,Tsujita T.²³,Nakayama T.²,Yamauchi Y.⁴,Nishitani M.³⁴,Kitagawa M.²,Yamauchi Y.⁵,Takai Y.¹

Affiliation:

1. Department of Material and Life Science, Graduate School of Engineering, Osaka University

2. 3rd Device Development Group, AVC Devices Development Center, AVC Networks Company, Panasonic Corporation

3. Co-operation Laboratory of Panasonic, Osaka University

4. Advanced Display Technology Group, Image Devices Development Center, Panasonic Corporation

5. National Institute for Materials Science

Publisher

Surface Analysis Society of Japan

Link

Reference38 articles.

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3. [3] H. S. Uhm, E. H. Choi, and J. Y. Lim, Appl. Phys. Lett. 80, 737 (2002).

4. [4] T. Hirakawa, S. Goto, S. Zhang, and H. Uchiike, Proc. International Display Workshops (IDW) '02 (Hiroshima, Japan, 2002) p. 749.

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