Micro-Spectroscopy in the Low-Energy Regime:Secondary Electron Detection and Energy Analysis in the Scanning Field-Emission Microscope-Reference-Cited by-同舟云学术

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Micro-Spectroscopy in the Low-Energy Regime:Secondary Electron Detection and Energy Analysis in the Scanning Field-Emission Microscope

Published:2019 Issue:2 Volume:26 Page:150-151
ISSN:1341-1756
Container-title:Journal of Surface Analysis
language:en
Short-container-title:JSA

Author:

Bellissimo Alessandra¹,Pescia Danilo¹,Walker Christopher²,Bertolini Gabriele¹,Suri Ashish³,Gürlü Oguzhan¹

Affiliation:

1. Laboratorium für Festkörperphysik, ETH Zürich

2. Department of Physics, University of York

3. Department of Electronics, University of York

Publisher

Surface Analysis Society of Japan

Link

https://www.jstage.jst.go.jp/article/jsa/26/2/26_150/_pdf

Reference6 articles.

1. [1] D. A. Zanin et al., Advances in Imaging and Electron Physics, Vol. 170, 227 (2012)

2. [2] T. L. Kirk, Advances in Imaging and Electron Physics,Vol. 204, 39 (2017)

3. [3] L. De Pietro, PhD Thesis, ETHZ, (2016),

4. [4] J. S. Villarrubia et al., Natl. Inst. Stand. Technol., Spec. Publ. 958, 214 (2001)

5. [5] A. Bellissimo, PhD Thesis, Università degli Studi Roma Tre, (2019)

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