Research on Electromagnetic Sensing Detection Technology for Non-Destructive Testing Applications
Author:
Wang Dongdong1, Cao Feng2, Guo Shuzhi2, Yu Yan1
Affiliation:
1. State Nuclear Power Plant Service Co., LTD , Shanghai , , China . 2. State nuclear power demonstration plant Co., LTD , Rongcheng , Shandong , , China .
Abstract
Abstract
Nondestructive testing technology, as an indispensable part of modern industrial production, is of great significance for guaranteeing product quality, improving production efficiency, and ensuring production safety. This paper is based on nondestructive testing and electromagnetic sensing detection technology research. The study first adopts ACFM detection to analyze the sensitivity of the surface defect parameters of the material to be detected, and based on the analysis of the magnetic circuit of the electromagnetic sensing structure, to build a mathematical model of ACFM and electromagnetic coupling probe, and then through the magnetic method of non-destructive testing on the material cracks in the detection of the signal effect of the study. The results show that the amplitude of the response signal increases with the increase of the defect angle from 0 to 7 ms, reaching a maximum value of 0.24–0.26 around 6 ms. The amplitude of the response signal decreases with the decrease of the defect angle from 7 to 14 ms and reaches a minimum value of −0.16–0.18 around 14.5 ms. The amplitude of the detection signal is related to the depth of the crack and the length of the surface defect of the steel sheet specimen. The crack depth and surface defect length of the steel plate specimen influence the detection signal’s magnitude. When the defect depth and surface length of the steel plate specimen are 1.5 mm, the detection signal value is weak, and the noise on the surface of the steel plate specimen has a significant effect on the detection signal. Promoting the development and application of NDT technology is greatly aided by the results of this paper.
Publisher
Walter de Gruyter GmbH
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