Characteristics of an Image Sensor with Early-Vision Processing Fabricated in Standard 0.35 μm Cmos Technology

Author:

Jendernalik Waldemar,Jakusz Jacek,Blakiewicz Grzegorz,Szczepański Stanisław,Piotrowski Robert

Abstract

Characteristics of an Image Sensor with Early-Vision Processing Fabricated in Standard 0.35 μm Cmos TechnologyThe article presents measurement results of prototype integrated circuits for acquisition and processing of images in real time. In order to verify a new concept of circuit solutions of analogue image processors, experimental integrated circuits were fabricated. The integrated circuits, designed in a standard 0.35 μm CMOS technology, contain the image sensor and analogue processors that perform low-level convolution-based image processing algorithms. The prototype with a resolution of 32 × 32 pixels allows the acquisition and processing of images at high speed, up to 2000 frames/s. Operation of the prototypes was verified in practice using the developed software and a measurement system based on a FPGA platform.

Publisher

Walter de Gruyter GmbH

Subject

Instrumentation,Control and Systems Engineering

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