An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet-Reference-Cited by-同舟云学术

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Published:2021-04-01 Issue:2 Volume:21 Page:61-66
ISSN:1335-8871
Container-title:Measurement Science Review
language:en
Short-container-title:

Author:

Tiryaki Erhan¹,Kocahan Özlem²,Özder Serhat³

Affiliation:

1. Department of Physics , School of Graduate Studies , Canakkale Onsekiz Mart University , 17020 , Canakkale , Turkey

2. Department of Physics, Faculty of Arts and Sciences , Namik Kemal University , Tekirdag , 59030 , Turkey

3. Department of Physics, Faculty of Arts and Sciences , Canakkale Onsekiz Mart University , Canakkale , 17020 , Turkey

Abstract

Abstract The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

Publisher

Walter de Gruyter GmbH

Subject

Instrumentation,Biomedical Engineering,Control and Systems Engineering

Link

https://www.sciendo.com/pdf/10.2478/msr-2021-0009

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