Abstract
Remarks on Statistical Design CenteringThe paper overviews optimization based statistical design centering techniques for analog circuits. Emphasis is placed on dependence between formulation of quality indices, problem formulation, and computational complexity of design centering algorithms, executed in single- or multiple-processor environments. For characterization of solution techniques a standard CMOS op-amp design case and a simplified computational complexity analysis are used.
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2 articles.
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1. Conclusion and Future Work;Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies;2020
2. Yield Estimation Techniques Related Work;Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies;2020