Remarks on Statistical Design Centering

Author:

Opalski Leszek

Abstract

Remarks on Statistical Design CenteringThe paper overviews optimization based statistical design centering techniques for analog circuits. Emphasis is placed on dependence between formulation of quality indices, problem formulation, and computational complexity of design centering algorithms, executed in single- or multiple-processor environments. For characterization of solution techniques a standard CMOS op-amp design case and a simplified computational complexity analysis are used.

Publisher

Walter de Gruyter GmbH

Reference30 articles.

1. A systematic approach to statistical modeling and its application to CMOS circuits;J. Chen,1993

2. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

3. Parametric yield formulation of MOS IC's affected by mismatch effect;M. Conti;IEEE Trans. Comput.-Aided Design Integr. Circuits Syst,1999

4. An efficient methodology for building macromodels of IC fabrication processes;K. Low;IEEE Trans. Comput.-Aided Design,1989

5. FABRICS II: a statistically based IC fabrication process simulator;S. Nassif;IEEE Trans. Comput.-Aided Design,1984

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