Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays-Reference-Cited by-同舟云学术

Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

Published:2022-08-01 Issue:4 Volume:59 Page:25-35
ISSN:2255-8896
Container-title:Latvian Journal of Physics and Technical Sciences
language:en
Short-container-title:

Author:

Ozols A.¹,Mozolevskis G.²,Zalubovskis R.³,Rutkis M.²

Affiliation:

1. EuroLCDs SIA, 2 Ventspils High Technology Park , Ventspils , , Latvia

2. Institute of Solid State Physics , University of Latvia , 8 Kengaraga Str ., Riga , , Latvia

3. Latvian Institute of Organic Synthesis , 21 Aizkraukles Str ., Riga , , Latvia

Abstract

Abstract We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

Publisher

Walter de Gruyter GmbH

Subject

Psychiatry and Mental health,Neuropsychology and Physiological Psychology

Link

https://www.sciendo.com/pdf/10.2478/lpts-2022-0031

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