Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Abstract

Abstract This study compares different types of scanning probe microscopy (SPM) probes according to the function of the surface layer at the tip apex. Three main types of SPM probes were analyzed: scanning tunneling microscopy (STM) tungsten probes, conductive atomic force microscopy (AFM) probes, and non-conductive AFM probes. The tungsten STM probes were coated with a graphite layer to simulate the effects of carbonization. The tested AFM probes were specifically NenoProbe conductive AFM probes (platinum-coated tip) and Akiyama non-conductive AFM probes coated with gold. The gold coating is intended to improve surface conductivity and help achieve a homogeneous, oxidation-resistant surface. The three samples were measured in a field emission microscope to study their current-voltage characteristics. The obtained current-voltage characteristics were tested and analyzed by the Forbes field emission orthodoxy test, providing the field emission parameters that correlate with the state of the scanning probe tip. In this study, the most important parameter is the formal emission area parameter, which indicates the formal tunneling current density through the probe tip-sample nanogap. For an STM tip, this reflects the size and shape of the region from which electrons tunnel to the sample surface. If this area is larger than expected or desired, it may indicate problems with tip function or tip wear. This information is critical for evaluating the performance and accuracy of the STM tip and can help diagnose problems and optimize its function.