TiO2 waveguides thin films prepared by sol-gel method on glass substrates with and without ZnO underlayer

Author:

Bouachiba Y.12,Taabouche A.23,Bouabellou A.2,Hanini F.4,Sedrati C.12,Merabti H.5

Affiliation:

1. Department of Materials Science Engineering , National Polytechnic School of Constantine , Nouvelle Ville Universitaire Ali Mendjeli , Algeria

2. Thin Films and Interfaces Laboratory , University of Mentouri Brothers , 25000 Constantine , Algeria

3. Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences , University Kasdi Merbah , 30000 Ouargla , Algeria

4. Department of Materials Science, Faculty of Exact Sciences and Natural Sciences and Life , University of Laarbi Tebessi , Tebessa 12000 , Algeria

5. Research Center in Industrial Technologies CRTI , ex CSC, B.P. 64, Cheraga , Algiers , Algeria

Abstract

Abstract TiO2 thin films have been deposited on glass substrates with and without ZnO underlayer by sol-gel dip coating process. XRD patterns show the formation of anatase phase with the diffraction lines (1 0 1) and (2 0 0) in TiO2/glass sample. In TiO2/(ZnO/glass) sample, TiO2 is composed of anatase phase with the diffraction line (2 0 0) but the diffraction peaks of ZnO wurtzite are also well-defined. The determination of the refractive index and the thickness of the waveguiding layers has been performed by m-lines spectroscopy. The thickness of TiO2 thin films deduced by Rutheford Backscattering Geometry (RBS) agrees well with that obtained by m-lines spectroscopy. TiO2/glass sample exhibits one guided TE0 and TM0 polarized modes. In TiO2/(ZnO/glass) sample, only, TE0 single mode has been excited due to cutoff condition.

Publisher

Walter de Gruyter GmbH

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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