Affiliation:
1. University of Massachusetts Amherst , 01003 Amherst, MA , U.S.A .
Abstract
Abstract
Heat dissipation in nanoelectronics has become a major bottleneck to further scaling in next-generation integrated circuits. In order to address this problem and develop more energy-efficient nanoelectronic transistor, sensor, and storage devices, we must understand thermal processes at the atomic scale, which requires numerical simulation of the interaction between electrons and heat, carried by quantized lattice vibrations called phonons. Here we examine in detail the phonon emission and absorption spectra in silicon at several elevated values for the electron temperature. The effect of electric field on the electron distribution and equivalent electron temperature is obtained from full-band Monte Carlo simulation for bulk silicon. The electron distributions are used to numerically compute the phonon emission and absorption spectra and discover trends in their behavior at high electron temperatures. The concept of electron temperature is used to understand the relationship between field and heat emission, and it is found that longitudinal acoustic (LA) phonon emission increases at high electron temperatures. It is also found that emission of slower zone-edge phonons increases for all phonon branches at high electron temperatures. These conclusions at high electric fields can be used to enable heat-conscious design of future silicon devices.
Reference35 articles.
1. [1] Z. Aksamija. U. Ravaioli: Joule heating and phonon transport in silicon MOSFETs, Journal of Comput. Electron., vol. 5, no. 4, pp. 431-434, 200610.1007/s10825-006-0045-2
2. [2] Z. Aksamija, I. Knezevic: Anisotropy and boundary scattering in the lattice thermal conductivity of silicon nanomembranes, Phys. Rev. B, 82.045319, July 201010.1103/PhysRevB.82.045319
3. [3] S. Sinha, K. E. Goodson: Phonon heat conduction from nanoscale hotspots in semiconductors. In Heat Transfer 2002, Proceedings of the Twelfth International Heat Transfer Conference, pp. 573–578, 200210.1615/IHTC12.4160
4. [4] J. Lai, A. Majumdar: Concurrent thermal and electrical modeling of sub-micrometer silicon devices, Journal of Applied Physics, vol. 79, no. 9, pp. 7353-7361, 199610.1063/1.361424
5. [5] J.A. Rowlette, K.E. Goodson: Fully coupled nonequilibrium electronphonon transport in nanometer-scale silicon fets, Electron Devices, IEEE Transactions on, vol. 55, no. 1, pp. 220-232, Jan. 200810.1109/TED.2007.911043
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