Author:
Lysiuk I.O.,Gumenjuk-Sichevska J.V.,Dvoretsky S.A.,Varavin V.S.
Abstract
AbstractWe have measured the current-voltage characteristics of the long-wavelength infrared (LWIR) photodiode array, formed on the epitaxial CdxHg1−xTe film (x = 0.21–0.23) with a high concentration of the Shockley-Read-Hall centres, before and after irradiating it with fast neutrons (energy 1 MeV, dose 5×1013 cm−2) at room temperature. Residual changes in current-voltage characteristics, persisting after 20 days, have been identified. Model calculations indicate that the Shockley-Read-Hall centre concentration increases 2–4 times, and the carrier lifetime decreases 2–5 times after the irradiation.
Subject
Electrical and Electronic Engineering,Radiation,General Materials Science
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