Real-time studies of epitaxial film growth using surface X-ray diffraction (SXRD)-Reference-Cited by-同舟云学术

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Real-time studies of epitaxial film growth using surface X-ray diffraction (SXRD)

Published:2011 Issue: Volume: Page:239-273
ISSN:
Container-title:In Situ Characterization of Thin Film Growth
language:
Short-container-title:

Author:

Eres G.,Tischler J.Z.,Rouleau C.M.,Larson B.C.,Christen H.M.,Zschack P.

Publisher

Elsevier

Link

http://woodhead.metapress.com/index/U0543K795272X355.pdf

Reference83 articles.

1. Kinetic pathways leading to layer-by-layer growth from hyperthermal atoms: a multibillion time step molecular dynamics study;Adamovic;Physical Review B,2007

2. Elements of modern x-ray physic;Als-Nielsen,2001

3. Determination of scaling exponents in Ag(100) homoepitaxy with X-ray diffraction profiles;Alvarez;Physical Review B,1998

4. Film growth mechanisms in pulsed laser deposition;Aziz;Applied Physics A,2008

5. In situ monitoring by reflective high-energy electron diffraction during pulsed-laser deposition;Blank;Applied Surface Science,1999

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