Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth-Reference-Cited by-同舟云学术

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Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth

Published:2011 Issue: Volume: Page:180-211
ISSN:
Container-title:In Situ Characterization of Thin Film Growth
language:
Short-container-title:

Author:

Staib P.G.

Publisher

Elsevier

Link

http://woodhead.metapress.com/index/R027436J03410254.pdf

Reference52 articles.

1. Drouin D, CASINO V2.42 – Program available for free from: http://www.gel.usherbrooke.ca/casino/What.html.

2. NIST Elastic Electron Scattering Cross Sections Database;Jablonski,2010

3. Mucal, Fluorescence yields and X-ray energies. Available from: http://www.csrri.iit.edu/mucal.html.

4. Surface Analysis by Auger andX-Ray Photoelectron Spectroscopy;Briggs;IM Publications and Surface Spectra Limited,2003

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