Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques-Reference-Cited by-同舟云学术

Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques

Published:2013 Issue: Volume: Page:398-420
ISSN:
Container-title:Handbook of Organic Materials for Optical and (Opto)electronic Devices
language:
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Author:

Pivrikas A.,Kepler Johannes

Publisher

Elsevier

Link

http://woodhead.metapress.com/index/TNRG54248W2464N5.pdf

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