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Capacitance measurements for diodes in the case of strong dependence of the diode-base series resistance on the applied voltage

  • Published:2000-01 Issue:1 Volume:34 Page:115-118
  • ISSN:1063-7826
  • Container-title:Semiconductors
  • language:en
  • Short-container-title:Semiconductors

Author:

Lebedev A. A.,Lebedev A. A.,Davydov D. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. A. A. Lebedev and N. A. Sobolev, Fiz. Tekh. Poluprovodn. (Leningrad) 16, 1874 (1982).

2. L. S. Berman and A. A. Lebedev, Deep-Level Transient Spectroscopy in Semiconductors [in Russian] (Nauka, Moscow, 1981).

3. O. V. Konstantinov and O. A. Merzin, Fiz. Tekh. Poluprovodn. (Leningrad) 17, 305 (1983).

4. Yu. A. Gol’dberg, O. V. Ivanova, T. V. L’vova, et al., Fiz. Tekh. Poluprovodn. (Leningrad) 17, 1068 (1983).

5. E. V. Astrova, A. A. Lebedev, and A. A. Lebedev, Fiz. Tekh. Poluprovodn. (Leningrad) 19, 1382 (1985).
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