Author:
Kamkin A. S.,Sergeeva T. I.,Smolov S. A.,Tatarnikov A. D.,Chupilko M. M.
Reference23 articles.
1. M.S. Abadir and S. Dasgupta, Guest editors’ introduction: Microprocessor test and verification, IEEE Design & Test Comput., 2000, vol. 17, no. 4, pp. 4–5.
2. Kamkin, A.S., Test program generation for microprocessors, in Trudy Instituta Sistemnogo Programmirovaniya Ross. Akad. Nauk, 2008, vol. 14, part 2, pp. 23–63.
3. http://www.arm.com/community/partners/displayproduct/rw/ProductId/5171/
4. Adir, A., Almog, E., Fournier, L., Marcus, E., Rimon, M., Vinov, M., and Ziv. A., Genesys-Pro: Innovations in test program generation for functional processor verification, IEEE Design & Test Comput., 2004, vol. 21, no. 2, pp. 84–93.
5. Mishra, P. and Dutt, N., Specification-driven directed test generation for validation of pipelined processors, ACM Trans. Design Autom. Electron. Syst. (TODAES), 2008, vol. 13, no. 3, pp. 1–36.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automated Testing of a TCG Frontend for Qemu;Programming and Computer Software;2020-12