Measurement of the diffusion length of minority charge carriers using real Schottky barriers-Reference-Cited by-同舟云学术

Measurement of the diffusion length of minority charge carriers using real Schottky barriers

Published:1997-07 Issue:7 Volume:31 Page:661-665
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Dmitruk N. L.,Borkovskaya O. Yu.,Mamykin S. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/1.1187060.pdf

Reference13 articles.

1. V. A. Tyagai, Fiz. Tverd. Tela (Leningrad) 6, 1260 (1964) [Sov. Phys. Solid State 6, 1156 (1964)].

2. N. L. Dmitruk and A. K. Tereshchenko, Élektron. Tekhn., Ser. 2, Poluprovodnikovye Pribory, No. 4, 68 (1972).

3. O. Yu. Borkovskaya, N. L. Dmitruk, M. Dubovinski, R. V. Konakova, O. N. Mishchuk, Yu. A. Tkhorik, P. Kardosh, and F. Shtofanik, Eleltrotechn. Čas. 40, 877 (1989).

4. N. L. Dmitruk, O. Yu. Borkavskaya, O. N. Mishchuk, and Ya. Charyev, Élektron. Tekhn., Ser. 2, Poluprovodnikovye Pribory, No. 1, 210 (1991).

5. J. Callaway, Phys. Rev., 134, A998 (1964).

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