Influence of deep energetic levels on charge densities and capacitance of semiconductor/electrolyte interface
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Published:2011-08
Issue:8
Volume:47
Page:890-899
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ISSN:1023-1935
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Container-title:Russian Journal of Electrochemistry
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language:en
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Short-container-title:Russ J Electrochem
Author:
Maachi B.,Hakiki N. E.
Publisher
Pleiades Publishing Ltd
Reference55 articles.
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