A version of the time-of-flight technique with a variable thickness of the generation layer and its use for verification of the type of electronic transport in molecularly doped polymers-Reference-Cited by-同舟云学术

A version of the time-of-flight technique with a variable thickness of the generation layer and its use for verification of the type of electronic transport in molecularly doped polymers

Published:2009-10 Issue:10 Volume:51 Page:1089-1095
ISSN:0965-545X
Container-title:Polymer Science Series A
language:en
Short-container-title:Polym. Sci. Ser. A

Author:

Tyutnev A. P.,Saenko V. S.,Ikhsanov R. Sh.,Pozhidaev E. D.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Polymers and Plastics

Link

http://link.springer.com/content/pdf/10.1134/S0965545X0910006X.pdf

Reference36 articles.

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2. A. P. Tyutnev, V. S. Saenko, E. D. Pozhidaev, and N. S. Kostyukov, Dielectric Properties of Polymers in Ionizing Radiation Fields (Nauka, Moscow, 2005) [in Russian].

3. H. Bässler, Phys. Status Solidi B 107, 9 (1981).

4. R. Richert, L. Pautmeier, and H. Bässler, Phys. Rev. Lett. 63, 547 (1989).

5. H. Bässler, Phys. Status Solidi B 175, 15 (1993).

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